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Improved power in multinomial goodness-of-fit tests
Ayanendranath Basu, Surajit Ray, Chanseok Parkand Srabashi Basu
Indian Statistical Institute, Calcutta, IndiaPenn State University, University Park, USAClemson University, USAIndian Statistical Institute, Calcutta, India
Address for Correspondence: Surajit Ray, Department of Statistics, Penn State University, University Park, PA 16802, USA. E-mail: surajit@stat.psu.edu
Copyright 2002 Royal Statistical Society
KEYWORDS
Disparities • Empty cell penalty • Goodness of fit • Power divergence

ABSTRACT

Summary.Pearson's χ2- and the log-likelihood ratio χ2-statistics are fundamental tools in goodness-of-fit testing. Cressie and Read constructed a general family of divergences which includes both statistics as special cases. This family is indexed by a single parameter, and divergences at either end of the scale are more powerful against alternatives of one type while being rather poor against the opposite type. Here we present several new goodness-of-fit testing procedures which have reasonably high powers for both kinds of alternative. Graphical studies illustrate the advantages of the new methods.


[Received March 2001. Revised April 2002]

DIGITAL OBJECT IDENTIFIER (DOI)
10.1111/1467-9884.00325 About DOI

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